Dr. Francis Alcorn is a postdoc in the Materials Physics group at Sandia National Labs working on novel scanning electron microscopy (SEM) instrumentation to augment understanding of semiconductor surfaces and interfaces, such as recent work on studying MoS2-LaCoO3 interfaces. These include ultrafast electron microscopy to measure fundamental speed limits for semiconductor measurements and secondary electron ‘plume’ imaging for measuring interfacial electric fields that underpin function of semiconductor devices. Dr. Alcorn did his PhD at the University of Illinois, studying atomic scale dynamics in light-absorbing materials with transmission electron microscopy for understanding light-matter interactions